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Agenda

MEMS Testing & Reliability 2017
4th Annual Workshop and Exhibition
Tuesday, August 1, 2017
Santa Clara, California


Tuesday, August 1

Registration and Breakfast 07:45 AM – 08:45 AM
Welcome and Opening Remarks
Mike Pinelis, PhD
President and CEO
MEMS Journal
08:45 AM – 09:00 AM
MEMS reliability: brief history, current status, and emerging trends
Allyson Hartzell
Scientific Consultant
Veryst Engineering
09:00 AM – 09:35 AM
Optical measurement techniques for dynamic characterization of MEMS devices
Eric Lawrence
MEMS Business Development Manager
Polytec
09:35 AM – 10:10 AM
Mid-Morning Break 10:10 AM – 11:00 AM
Testing high performance MEMS microphones
Gerard John
Sr. Director, Advanced Packaging R&D
Amkor Technology
11:00 AM – 11:45 AM
Mechanical tests to determine MEMS microphones robustness
Ketan Patel
Vice President, Quality and Reliability
Akustica
11:45 AM – 12:20 PM
Sponsor Introduction – Plan Optik 12:20 PM – 12:30 PM
Networking Lunch 12:30 PM – 01:45 PM
Dielectric charging on capacitive RF MEMS devices
David Molinero, PhD
Senior MEMS Characterization Engineer
Wispry
01:45 PM – 02:30 PM
Testing MEMS devices: current challenges and emerging trends
Richard Chrusciel
Product and Business Development Manager
FocusTest
02:30 PM – 03:05 PM
Sponsor Introduction – Quantum Analytics 03:05 PM – 03:15 PM
Mid-Afternoon Break 03:15 PM – 03:55 PM
Technology Showcase

Ari Kuukkula
Sales Director
Afore


Gary Williams
Sales Manager
FRT of America


Bill Moffat
CEO & Founder
Yield Engineering Systems

03:55 PM – 05:10 PM
Concluding Remarks 05:10 PM – 05:20 PM
Reception 05:20 PM – 07:00 PM

Agenda and panels are subject to change.